基于参数回归分析的金属化膜脉冲电容器竞争失效分析  

Reliability Analysis of Metallized Film Pulse Capacitors under Competing Failure Modes Based on Regression Analysis

作　　者：刘芳[1] 赵建印[1] 彭绍雄[1] 

机构地区：[1]海军航空工程学院飞行器工程系,山东烟台264001

出　　处：《电子器件》2011年第2期137-140,共4页Chinese Journal of Electron Devices

基　　金：国家863计划项目资助课题(2004AA845023)

摘　　要：金属化膜脉冲电容器既有突发型失效又有退化型失效。通过分析金属化膜脉冲电容器的退化失效机理,在假设突发失效与退化失效相关的条件下,给出了基于参数回归分析的电容器竞争失效的一般模型,最后利用该模型对某金属化膜脉冲电容器的试验数据进行可靠性分析。根据评估结论,该电容器打靶10 000发的可靠度为0.798 6。该模型为竞争失效模式下电子产品可靠性评估提供了一种新的有效途径。The failures of metallized-film capacitor have two modes：traumatic and degradation failures.By analyzing degradation mechanism of metallized-film capacitor,a general model under competing failure modes involving both traumatic and degradation failures is given based on parameter regression analysis,and used to analyze the test data of some capacitors.According to the assessment results,the reliability probability of the capacitors is 0.7986 for 10 000 shots.This model provides an effective method to assess the reliability of electronic products under competing failures modes.

关 键 词：可靠性分析 退化失效 竞争失效 金属化膜脉冲电容器 

分 类 号：TB114.3[理学—概率论与数理统计]