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作 者:左兆陆[1] 郑宾[1] 甘潦[2] 邓勇[2] 白福明[1]
机构地区:[1]中北大学电子测试技术国家重点实验室,山西太原030051 [2]中国人民解放军驻061基地,贵州贵阳550009
出 处:《工程设计学报》2011年第2期149-152,共4页Chinese Journal of Engineering Design
摘 要:各行业对测速系统测量精度的要求日益严格,也对作为常用测速系统之一的光幕测速系统提出了更高的测速精度要求.为提高光幕测速系统的测速精度,设计了一种基于红外线光电开关和NI6220高速数据采集卡的测速系统,代替了应用单片机等自行设计的硬件电路进行数据采集的测速系统,提高了测速系统的可靠性和测量精度.介绍了该测速系统的工作原理、系统结构以及基于LABVIEW的软件设计,并进行了测速系统的误差分析.现场比较试验结果证明,在测试1 000 m/s以下速度时,该测速系统能将测速误差控制在0.0156%以内.Many fields require a stringent measurement precision of the speed test systems increasingly,and ask a harsher requirement for light curtain speed test system at the same time,which is a kind of common speed test systems.In order to improve the measurement precision of the speed test system based on infrared light screen,a speed test system based on infrared rayphotoelectric switches and NI6220 DAQ was introduced,which may take the place of the traditional DAQ system based on the SCM,and improved the reliability and measuring precision of speed test system.Working principles,structure design and software design based on LABVIEW were introduced,and the system errors also were analyzed.Experimental results prove that this method can ensure the test error in less than 0.0156%,when the speed is slower than 1 000 m/s.
关 键 词:测速系统 数据采集 LABVIEW 红外光电开关
分 类 号:TH722[机械工程—仪器科学与技术]
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