原子力显微镜在纳米材料表面形貌及粒度的研究  

Atomic Force Microscope Study on Morphology and Particle Size of Nanomaterials

作　　者：梁志辉[1] 陈舰[1] 

机构地区：[1]东莞理工学院化学与环境工程学院,广东东莞523808

出　　处：《广东化工》2011年第4期103-105,共3页Guangdong Chemical Industry

摘　　要：在探测纳米尺寸上、分子水平上的表面形貌,原子力显微镜是最先进的测试工具之一。文章主要是在室温大气条件下,用原子力显微镜分别对液相化学沉淀法制备的羟基磷灰石(HAP)粉体,压片后在马福炉中用不同的温度和时间烧结,得到不同烧结状态的样品表面进行扫描成像,并用原子力显微镜分析软件分析发现羟基磷灰石样品颗粒的平均尺寸随温度升高而增大的变化趋势。并用RISE-2008型激光粒度分析仪测样品颗粒粒度作对比测试印证原子力显微镜测试结果的可靠性。In the detection of nanometer size,the level of molecules on the surface morphology,AFM is the most advanced testing tool.The paper discussed that at room temperature atmospheric conditions,by using atomic force microscope on the liquid chemical precipitation method of hydroxyapatite（HAP） powder,which was pressed later in a muffle furnace using different sintering temperature and time,got different sintering state of the sample surface scan imaging,and found the change trend that samples of hydroxyapatite particles grew larger with increasing temperature by atomic force microscopy analysis software.At last,testing results＇reliable of atomic force microscope verified by comparing size of sample particle with RISE-2008 laser particle size analyzer.

关 键 词：原子力显微镜 羟基磷灰石 激光粒度分析仪 

分 类 号：TB383[一般工业技术—材料科学与工程]