X-射线荧光光谱法直接测定电工硅钢钢屑中的微量元素  

Direct Determination of Micro Amounts of Elements in Electrician Silicon Steel Chips by X ray Fluorescence Spectrometry

作　　者：郝贡章[1] 卜赛斌[1] 高新华 谢荣厚 

机构地区：[1]北京有色金属研究总院,北京100088

出　　处：《分析试验室》1999年第6期59-62,共4页Chinese Journal of Analysis Laboratory

摘　　要：报道了Ｘ射线荧光光谱法直接测定电工硅钢钢屑样品微量元素的新方法，校正了样品中元素间的基体效应影响和校正了钢屑样品的不同颗粒结构，不同几何形态及不同表面状态的影响，使钢屑样品可不经处理直接测定，操作简便。The new method of direct determination of micro amounts of elements in electrician silicon steel chips is based on the high performance of PW 2400 X ray fluorescence spectrometer system and its software.It can correct both the matrix effect and the influence of sample physical status.Specimens of steel chips can be determined directly without any pretreatment.The method has high accuracy and precision,the operation is easy and the analysis is fast.

关 键 词：XRF 电工硅钢 钢屑样品 微量元素 直接测定 

分 类 号：TM241.013[一般工业技术—材料科学与工程] TG115.336[电气工程—电工理论与新技术]