介质谐振器法测量超导微波表面电阻  

DIELECTRIC RESONATOR METHOD FOR MEASUREMENT OF MICROWAVE SURFACE RESISTANCE OF SUPERCONDUCTING THIN FILMS

作　　者：李伟华[1] 黄贺生[1] 曹必松[1] 朱美红 张雪霞[2] 张留碗[1] 吴振一[1] 周岳亮[3] 何萌[3] 陈正豪[3] 

机构地区：[1]清华大学现代应用物理系,北京100084 [2]清华大学电子工程系,北京100084 [3]中国科学院物理研究所,北京100080

出　　处：《低温物理学报》1999年第6期438-441,共4页Low Temperature Physical Letters

基　　金：国家自然科学基金

摘　　要：高温超导薄膜材料在微波器件中应用的出发点主要是利用它在临界温度下极低的表面电阻．因此要对超导器件性能作出准确的评估，必须精确测量超导薄膜的微波表面电阻．本文提出了利用蓝宝石介质圆柱的ＴＥ０１１ 谐振模式来测量超导微波表面电阻的一种方法．设计并制作了工作于１８ ．９ＧＨｚ 和１７ ．６ＧＨｚ 的两种高Ｑ 值谐振器．其在测试中表现出了相当高的灵敏度．同时具有不损坏被测薄膜，安装调试简单方便，可重复性好的优点．可用于测量尺寸不小于Ф１０ｍｍ 的超导薄膜．In this paper, we put forward a dielectric resonator method for accurate measurement of microwave surface resistance of superconducting thin films. The resonator used sapphire as dielectric cylinder and resonated in its TE\-\{011\} mode. Two high Q value resonators working at 18.9GHz and 17.6GHz respectively were designed and fabricated. In the tests they showed quite good sensitivity and meanwhile they were nondestructive and very repeatable. They can be used to test the superconducting thin films with dimension not less than Ф10mm.

关 键 词：介质谐振器 超导薄膜 微波器 表面电阻 

分 类 号：TM925.5[电气工程—电力电子与电力传动]