基于遗传粒子群算法的模拟电路测试点选择  

Test Point Selection of Analog Circuits Using Genetic Particle Swarm Optimization Algorithm

作　　者：罗沛清[1] 梁青阳[1] 江钦龙[1] 

机构地区：[1]空军航空大学,吉林长春130022

出　　处：《计测技术》2011年第2期1-3,20,共4页Metrology & Measurement Technology

摘　　要：针对模拟电路测试点选择的特点,提出利用遗传粒子群算法与整数编码故障字典相结合的方法进行测试点选择。首先根据各测试点的数据建立整数编码故障字典,然后利用遗传粒子群算法选取最优测试点。将该方法应用于实际模拟滤波器的测试点选择,结果表明:利用该方法很容易求出模拟电路的全局最优测试点。A method based on genetic particle swarm optimization algorithm and integer-coded fault dictionary was proposed for selecting the optimum test points of analog circuits.Firstly,the integer-coded fault dictionary was constructed based on the original data of test points.Then the genetic particle swarm optimization algorithm was used to find the optimum test points.The proposed method was used to select the test points of an analog filter and compared with other methods by statistical experiments.The results show that this method is easy to find the global optimum test points.

关 键 词：模拟电路 故障诊断 遗传粒子群算法 测试点选择 

分 类 号：TN710[电子电信—电路与系统]