BL14W1光束线XAFS实验站极低浓度数据采集系统  

A data acquisition system for XAFS analysis of sample s of extremely low concentration on BLl4Wlbeam line at SSRF

作　　者：顾俊俊[1] 邹杨[1] 魏向军[1] 刘平[1] 高倩[1] 于海生[1] 姜政[1] 黄宇营[1] 徐洪杰[1] 

机构地区：[1]中国科学院上海应用物理研究所,上海201204

出　　处：《核技术》2011年第5期341-344,共4页Nuclear Techniques

基　　金：国家自然科学基金青年基金(批准号11005148);中国科学院院长基金特别支持项目(批准号29)资助

摘　　要：介绍上海光源BL14W1 XAFS光束线实验站的极低浓度数据采集系统。该系统采用XFlash5040硅漂移固体探测器配合气体电离室、电流放大器及数据采集卡等仪器设备,以及用Labview软件编写的控制和采集程序。对Fe浓度为5.0μg/g的FeCl_3水溶液样品和1nm厚的Ni薄膜样品进行了XAFS谱的测量。测量结果表明,该光束线实验站已成功实现极低浓度数据采集系统。In this paper, we report development of a data acquisition system for XAFS （X-ray absorption fine structure） analysis of samples of extremely low concentrations on the BL14W1 beamline at Shanghai Synchrotron Radiation Facility （SSRF）. The system includes an XFlash 5040 silicon drift detector, ion chamber, amplifier, ADC etc. Labview software was used to write the data acquisition program. Fluorescence K-edge XAFS spectra of FeCl3 aqueous solution containing 5.0 μg/g Fe and a 1 nm Ni thin film were used to demonstrate performance of the system. The test results indicate that the data acquisition system ofBL14W1 XAFS beamline is capable of measuring samples of extremely low concentrations.

关 键 词：XAFS LABVIEW 硅漂移固体探测器 极低浓度 

分 类 号：TG115.22[金属学及工艺—物理冶金] TL503.6[金属学及工艺—金属学]