一种基于白光迈克耳孙干涉仪波片延迟量的测量方法  

Retardation Measurement of Wave Plates Using White-Light Michelson Interferometer

作　　者：王军[1] 陈磊[2] 吴泉英[1] 姚庆香[1] 

机构地区：[1]苏州科技学院数理学院,江苏苏州215009 [2]南京理工大学电光学院,江苏南京210094

出　　处：《中国激光》2011年第5期192-199,共8页Chinese Journal of Lasers

基　　金：江苏省"六大人才高峰"项目(06-E-030)资助课题

摘　　要：将白光偏振干涉和迈克耳孙干涉仪相结合,提出了一种利用空间白光干涉图测量波片延迟量(包括级次信息)的方法。白光偏振干涉系统产生两束振动方向相同的线偏光,进入迈克耳孙干涉仪后分别被两干涉臂的平面镜反射,并两两干涉,在空间形成3组白光干涉包络。当被测件为多级波片时,根据白光干涉包络之间的光程差就可求得被测延迟量;当被测件为低级次波片时,利用白光干涉信号相位的改变量计算出延迟量的值。实验分别测量了多级波片和零级全波片的延迟量,其结果与使用光谱扫描法测量得到的结果均相吻合。A method using white-light Michelson interferometer and polarization interferometry system for measuring the retardation of wave plates （including the order of retardation） is presented. The linear polarized whitelight passes through the test wave plate which introduces retardation between the o-beam and e-beam, and then they are divided by a beam splitter and reflected by two plane mirrors of the Michelson interferometer respectively. Finally three white-light interference packets are formed. For a multiple-order wave plate, the interference packets will be separated absolutely, and according to the optical path between the center packet and one of the side packets, the retardation of multiple-order wave plates can be obtained. The retardation of a lower-order wave plate and the stress of a optical glass can be calculated by using the phase variation after inserting it behind the multiple-order wave plate. The retardations of a multiple-order and zero-order wave plate are measured in experiments, whose results coincide with the ones obtained bv sDectroscoDic method.

关 键 词：测量 波片 延迟量 白光迈克耳孙干涉仪 偏振干涉 

分 类 号：O436.3[机械工程—光学工程] TN247[理学—光学]