晶体取向测量的计算公式及其图解法  

Computing Formulae and Illustration Method for Crystal Orientation Measurement

作　　者：付玮[1] 符梁屏[1] 

机构地区：[1]南昌航空大学无损检测技术教育部重点实验室,南昌330063

出　　处：《材料导报》2011年第8期122-126,共5页Materials Reports

基　　金：国家自然科学基金(60675022);江西省自然科学基金(2008GZS0034)

摘　　要：为了便于测量和计算,通过系统X射线衍射实验研究和理论分析,改进了X射线衍射透射及反射几何关系图,推导出定量计算公式,并创立了晶体取向测量图形。使用这种定量计算公式及图形可以非常简便、迅速而又准确地得到晶体取向的反射衍射斑点θR和透射衍射斑点θT。为了便于精确测量和更有效地利用高级测试仪器,在X射线衍射仪日常工作的同时,使用原有线焦点等实验方法进行了累计X射线衍射斑点拍照研究。结果表明,用射线源线焦点拍照的精确度与点焦点相同,操作方便,并可大大缩短调机和开机时间,充分发挥了X射线衍射仪的作用。By system X-ray diffraction experiments study and theory analysis, X-ray diffraction reflection and transmission geometry relation were improved and ration calculation formulae were deduced and crystal orientation measuring graphics were founded. This method is simple, rapid and true by use of the ration calculation formulae obtaining crystal orientation reflection diffraction spots OR and transmission diffraction θr. During daily diffraction instrument working, for making use of advanced measuring instrument effective, original line focus was photographed by ac- cumulative diffraction focus. The result indicates that precision of line focus photographed is the same as point focus and it cuts down boot-strap time and brings into play X-ray diffraction instrument largely.

关 键 词：晶体取向 衍射斑点 线焦点 θ角圆形图 X射线源 

分 类 号：O722[理学—晶体学]