光子晶体介电常数和波导宽度对负折射现象的频率的影响  

Dependence of Negative Refraction Phenomenon Frequency on Photonic Crystals of Dielectric Constant and Waveguide Width

作　　者：张兴娇[1] 肖永江[1] 占丽娜[1] 文如泉[1] 

机构地区：[1]萍乡高等专科学校,江西萍乡337000

出　　处：《江西科学》2011年第2期160-162,168,共4页Jiangxi Science

摘　　要：为研究光子晶体中的负折射情况,利用时域有限差分法（FDTD）并通过模拟仿真观察了光在左手材料光子晶体中的负折射现象。以硅的圆形介质柱组成的二维六边形排列结构的光子晶体为例,分析了介电常数和波导宽度的变化对负折射现象的频率范围的影响。仿真结果显示：相对介电常数不宜过大,波导宽度根据频率选择的需要可采在0.2~0.5 a范围内选取,从而为制作具有负折射现象的宽带宽光子晶体提供参考。For research the negative refractive phenomenon in the photonic crystals,the simulation with finite-difference time-domain（FDTD） method shows the negative refractive phenomenon on the photonic crystal.The photonic crystals of hexagonal structure with silicon circle rods are taken as examples to illuminate the dependence of negative refraction phenomenon frequency on dielectric constant and waveguide width in two-dimensional photonic crystals.The simulated result shows that the relative dielectric constant should not be too big,waveguide width is selected in range of 0.2~0.5 a in need.It provides the reference for the production of wide bandwidth photonic crystals with negative refraction phenomenon.

关 键 词：左手材料 负折射现象 光子晶体 

分 类 号：TN252[电子电信—物理电子学]