熔融制样-X射线荧光光谱法测定重晶石中的主要组分  

Determination of Main Componets in Baryte by XRay Fluorescence Spectrometry with Fused Sample Preparation

作　　者：曾小平[1] 宋武元[2] 吴冰[1] 

机构地区：[1]华南理工大学分析测试中心,广州市天河区五山路381号510640 [2]广东出入境检验检疫局

出　　处：《光谱实验室》2011年第3期1311-1314,共4页Chinese Journal of Spectroscopy Laboratory

摘　　要：采用熔融片制样法,X射线荧光光谱仪(XRF)同时测定防辐射用重晶石中氧化钡和二氧化硅等主次组分的含量,用基本参数法校正基体效应,并进行了方法的精密度和准确度试验,各组分相对标准偏差RSD(n=10)均小于6.0%。用标准物质进行验证,测量值与之基本一致。A method for simultaneous determination of SiO2,BaO and other components in the radiation-proof baryte was developed by X-ray fluorescence spectrometry with fused bead sample preparation.The matrix effect was corrected by fundamental parameter method,and the precision and the accuracy of method were investigated with RSD less than 6%（n=10） for various components.The method was proved by standard reference materials,and the measured value were agreement with the results.

关 键 词：X射线荧光光谱法 重晶石 熔融片 

分 类 号：O657.34[理学—分析化学]