C/SiC复合材料微结构的显微CT表征分析  

MicroCT Characterization on Microstructure of C/SiC Composites

作　　者：冯炎建[1] 冯祖德[1] 李思维[2] 张伟华[2] 栾新刚[2] 刘永胜[2] 成来飞[2] 

机构地区：[1]厦门大学材料学院,福建厦门361005 [2]西北工业大学超高温结构复合材料国防科技重点实验室,西安710072

出　　处：《航空材料学报》2011年第2期49-54,共6页Journal of Aeronautical Materials

基　　金：国家自然科学基金(90405015;51002120)

摘　　要：利用显微CT表征了采用化学气相渗透法(CVI)制备的3D C/SiC复合材料的三维结构,评价了显微CT的微结构表征能力。结果表明:显微CT能够有效地分辨C/SiC复合材料的织构形貌、材料内部缺陷(孔隙和SiC基体密度差异)。通过重构孔隙的三维结构,揭示了CVI过程预制体内部存在沉积气体滞留;通过重构孔隙壁的形貌,揭示了CVI SiC基体表面为球状颗粒形貌,并与化学气相沉积(CVD)SiC涂层表面SEM形貌进行对比,阐明了预制体内外在气相沉积过程中存在压差的本质。Nondestructive three-dimensional structure of 3D C/SiC composites fabricated by chemical vapor infiltration（CVI） was characterized using X-ray microcomputed tomography（MicroCT）.The current study was undertaken to assess the capabilities and limitations of MicroCT for the characterization of C/SiC composites.Results demonstrate that MicroCT can facilitate characterization of fabric morphology,defects（porosity and the different densities of SiC matrix） in 3D C/SiC composites.A gas retention and viscous flow formation in the preform was revealed in the light of three-dimensional porosity.A nodular surface morphology of SiC matrix fabricated by CVI was observed by reconstructing the matrix porosity-wall.Comparing with the SEM surface morphology of SiC coating fabricated by chemical vapor deposition（CVD）,pressure difference between the inner and outer preform was demonstrated.

关 键 词：C/SIC复合材料 显微CT 微结构 预制体 孔隙 

分 类 号：TB332[一般工业技术—材料科学与工程]