有源像素CMOS图像传感器非均匀性研究  

Study on the Non-uniformity of CMOS Image Sensor

作　　者：严奕[1,2] 邓若汉[1,2] 陈永平[1] 陈世军[1] 

机构地区：[1]中国科学院上海技术物理研究所,中国科学院红外成像材料与器件重点实验室,上海200083 [2]中国科学院研究生院,北京100039

出　　处：《科学技术与工程》2011年第15期3449-3455,共7页Science Technology and Engineering

摘　　要：有源像素CMOS图像传感器在许多领域有着重要的应用,但其非均匀性问题影响着成像质量,非均匀性控制一直是器件研发过程中需要重点考虑的问题之一。在分析CMOS图像传感器的工作原理的基础上,对非均匀性的来源及其表现形式进行了深入的分析,提出了3套不同层次的均匀性优化设计方案,分别从像素级、列级、芯片级三个不同的角度来评价非均匀性问题。研究结果对于设计高均匀性的图像传感器具有指导意义。CMOS image sensor is widely used in many fields,but its non-uniformity problem deteriorates the image,as a result of which the control of non-uniformity during the development of the sensors is greatly concerned.Based on the analysis of the working principle of CMOS image sensor,the research on the sources of non-uniformity is carried out,and proposed 3 kinds of design plan,each focused on different design levels such as pixel level,column level and chip level.The results pave the way for the future design of CMOS image sensor with high uniformity.

关 键 词：图像传感器 非均匀性 固定图案噪声 

分 类 号：TN27[电子电信—物理电子学]