X-射线荧光光谱法分析硅质耐火材料的主次成分  

DETERMINATION OF MAJOR AND MINOR COMPONENTS IN SILICA REFRACTORIES BY X-RAY FLUORESCENCE SPECTROMETRY

作　　者：吴增升 刘志民 

机构地区：[1]中国第一重型机械集团天津重型装备工程研究有限公司,天津300457

出　　处：《化学分析计量》2011年第3期43-45,共3页Chemical Analysis And Meterage

摘　　要：采用硅石标准样品作为校准样品,建立了熔融制样X-射线荧光光谱法测定硅质耐火材料中SiO2、Al2O3、CaO、MgO、P2O5、Fe2O3、TiO2、K2O、Na2O的方法。采用熔融法为样品片和校准片的制备方法,选择四硼酸锂-偏硼酸锂(质量比为67∶33)为助熔剂,1.00 mL LiBr溶液为脱模剂,熔融温度1100℃,熔融时间20 min。采用理论α系数对基体效应进行校正。对同一硅石样品进行测定,结果的相对标准偏差小于3%(n=10),对不同硅石标准样品进行测定,测定结果与认证值相吻合。A method was introduced for determination of major and minor components including SiO2, Al2O3, CaO, MgO, P2O5, Fe2O3 , TiO2 , K2O, Na2O in silica refractories by X -ray fluorescence spectrometry with silica standard sample as calibration sample. The preparation of testing sample and calibration sample were carried out by fusion method. Other experimental conditions were confirmed as follow： Li2B4O7 -LiBO2 （mass ratio was 67：33） as fusing agent, 1 mL of LiBr as remover, the fusion temperature was 1100 ℃, fusion time was 20 min. Matrix effect was calibrated by using ℃ coefficient of variable theory. Comparative tests for the same sample showed that the relative standard deviation was less than 3 % （ n = 10） , while the determination results of different standard sam- ples were consistent with the certified values.

关 键 词：X-射线荧光光谱 硅质耐火材料 熔融制样 

分 类 号：TQ426[化学工程]