基于Bayes的量度继电器成功率可靠性验证试验  

Reliability Compliance Test Plan of Success Ratio\=Based on Bayes Theory for Measuring Relay

作　　者：唐义良[1,2] 王景芹[1,2] 陆俭国 

机构地区：[1]清华大学 [2]河北工业大学

出　　处：《系统工程与电子技术》1999年第8期60-63,共4页Systems Engineering and Electronics

基　　金：天津市21世纪青年科学基金

摘　　要：提出了量度继电器的可靠性指标体系，研究了用Ｂａｙｅｓ理论设计航天、航空用量度继电器产品的成功率验证试验方案。并与经典方法设计的成功率验证试验方案进行了比较。在特定的先验信息下，Ｂａｙｅｓ方案所需样本容量较小。This paper introduces a reliability indexs for measuring relay.The compliance test plan of success ratio for measuring relay is studied through the application of Bayesian theory.The paper compares the methods of classical statistical theory and Bayesian theory for making sampling plan of success ratio.The investigation shows that the sample size of the test plan based on Bayes theory is smaller than the classical test plan on special condition.

关 键 词：可靠性 验证试验 继电器 bayes理论 量度继电器 

分 类 号：TM588.06[电气工程—电器]