同步辐射双晶单色器平行度测量方法研究  

A new method to measure the parallelism error of synchrotron radiation from double-crystal monochromator

作　　者：刘石磊[1,2] 王丽[1,2] 徐中民[1] 王纳秀[1] 

机构地区：[1]中国科学院上海应用物理研究所,上海201800 [2]中国科学院研究生院,北京100049

出　　处：《核技术》2011年第6期411-414,共4页Nuclear Techniques

摘　　要：针对上海光源(SSRF)光束线建设和晶体单色器须进行双晶晶体表面(晶面)平行度离线测量的需求,探讨了利用十字位相板改进后光笔干涉仪法测量双晶晶体表面平行度的可行性,并开展原理性实验。该方法克服了自准直仪法不能测量晶面绝对平行度的缺陷,并实现了同时测量双晶单色器的二维平行度。在本实验装置下,投角和滚角的理论测量精度可达0.89″和1.79″,为调节双晶单色器晶面平行度提供一种新的测量方法。In order to measure the parallelism error of synchrotron radiation double-crystal monochromator off-line,a new method was developed at SSRF.A pencil beam interferometer improved with a cross phase plate is used to measure the parallelism error and carry out the principle experiment.This method overcomes the defects of autocollimator.It can measure the absolute parallelism of the two double crystals in two directions simultaneously and the theoretical measurement accuracy of pitch and roll is 0.89＇＇ and 1.79＇＇ in this experiment,respectively.

关 键 词：双晶单色器 平行度 光笔干涉仪 

分 类 号：TH744.2[机械工程—光学工程]