双晶单色器固定高差相对检测技术研究  

A method for precision measurement of invariable relative height in double crystal monochromator

作　　者：杨晓许[1] 周泗忠[1] 闫旻奇[1] 韩俊峰[1] 江波[1] 郭治理[1] 邓小国[1] 张周峰[1] 

机构地区：[1]中国科学院西安光学精密机械研究所,西安710119

出　　处：《核技术》2011年第6期419-422,共4页Nuclear Techniques

摘　　要：简述了同步辐射光束线中双晶单色器的基本原理和固定高差原理,介绍了固定高差相对变化的离线检测方法,并对该检测技术进行精度分析。结果表明:影响检测精度的主要因素是光斑判读精度,检测实例显示,检测精度可达4.9μm,满足精度需求。In this paper,the principle of double crystal monochromator in beam lines of synchrotron radiation facilities is introduced,and the technique of invariable relative height in double crystal monochromator is used to keep the height of the beam from the monochromator.A CCD imaging system and an image processing system are used for off-line test.The precision is analyzed.The results show that the measurement precision of relative beam height is primary factor.The precision of the system reaches 4.9 μm,which meets the testing requirement.

关 键 词：同步辐射 双晶单色器 固定高差 离线检测 

分 类 号：TH744[机械工程—光学工程] TB131[机械工程—仪器科学与技术]