采用反相位线性结构光栅编码的相移测量三维轮廓术  

Three dimensional Surface Profilometry Using Two Phase opposite Linear Grate Lights Phase shifting Method

作　　者：刘维一 王肇圻[1] 母国光[1] 方志良[1] 

机构地区：[1]南开大学现代光学研究所

出　　处：《光电子．激光》1999年第5期428-430,共3页Journal of Optoelectronics·Laser

基　　金：国家自然科学基金

摘　　要：研究了一种线性周期编码光栅的三维轮廓术，其中采用了两个相位相反的线性周期变化的光栅光场和一个均匀光场，对被测物体进行三次采样。在获得物体三维轮廓的同时，又获得了物体的表面纹理。当背景光很暗时，经过两次采样即可获得物体的三维轮廓。通过理论分析，采用相位相反的线性周期光栅光场与相位相差１／２周期的线性周期光栅光场相比，检测精度可以提高近１ 倍。A new linear coded profilometry,which uses two phase opposite linear grate lights and one homogeneous light,is presented.By three time measurements,we can obtain not only the shape of the object,but also the surface texture.When the background light is dark enough,the shape of the object can be obtained by two time measurements.Though theoretical analysis,the precision with this technique is almost one time higher than the linearly coded profilometry with two half period phase shifting grate lights.

关 键 词：反相位 线性编码 相移 三维轮廓术 光栅 

分 类 号：TN253[电子电信—物理电子学]