JEM-1200EX型电镜SENSITIVITY值与电子照射密度之间关系的测量分析  

Measurement and analysis of the relationship between sensitivity value and the charge density by electronic irradiation on film of JEM\|1200EX type electron microscope

作　　者：朱永哲[1] 金英锦[1] 文香兰 李英 姜重建 金奎龙 

机构地区：[1]延边大学医学院电镜室,延吉133000

出　　处：《电子显微学报》1999年第5期562-566,共5页Journal of Chinese Electron Microscopy Society

摘　　要：ＳＥＮＳＩＴＩＶＩＴＹ（ＳＥ）代表电镜在照像时电子照射到电镜底片上的电子照射密度（σ）。通过测量、分析ＳＥ取各不同值时ＥＸＰＴＩＭＥ及其相应的ＣＵＲＲＥＮＴＤＥＮＳ的取值范围，计算出了与各ＳＥ值相对应的电子照射密度σ（即ＥＸＰＴＩＭＥ值与ＣＵＲＲＥＮＴＤＥＮＳ值的乘积）的取值范围。由此，分析。To JEM\|1200EX type electron microscope,the value of sensitivity(SE) stands for the charge density(σ) that irradiated on film.Computed the value limits of σ(The product of the value of EXP time and the value of current dens) that corresponded to each value of SE by measuring and analyzing the value limits of EXP time and the value limits of current dens that corresponded to each value of SE.According to this,we analyzed and computed the functionship of SE and σ,drawing the relationship curve. 

关 键 词：电子显微镜 SENSITIVITY 电子照射密度 

分 类 号：TN16[电子电信—物理电子学]