基于单片机改造迈氏干涉仪自动测量微小长度  

SCM-based Improved Michelson Interferometer for Automatic Measurement of Tiny Length

作　　者：彭真真[1] 赵硕浛[1] 刘月林[1] 程匹克[1] 陈程[1] 

机构地区：[1]湖北师范学院物理与电子科学学院,湖北黄石435002

出　　处：《现代电子技术》2011年第11期150-153,共4页Modern Electronics Technique

摘　　要：为了能精确地自动测量He-Ne激光波长和透明薄膜厚度,采用单片机驱动步进电机带动迈克尔干涉仪的微调手轮转动,使光屏上产生稳定变化的干涉条纹,用光电二极管检测条纹信号光强变化,通过光电转换电路将光信号转变为电信号,输入到单片机进行处理,测量结果自动显示在液晶屏上。在一般实验环境下进行了多次实验,将实验结果与标准值进行比较得出,改造后的仪器测量微小长度速度快,误差小,精确度高。In order to measure the wavelength of He-Ne laser and the thickness of a transparent thin film accurately,Michael interferometer with rotating of the fine-tuning hand-wheel driven by MCU controlled stepping motor is used,which makes the screen to show the stably-changed interference fringes.The stripe signal is detected by photosensitive diode,and then handled by the circuit of photoelectric conversion which converts light signal to electrical signal,which is transmitted into MCU for processing.The measuring result is automatically displayed on LCD.Automatic measurements in the general experimental environment was taken repeatly.Compared with the standard value,the modified Michelson interferometer has higher accuracy and higher efficiency.

关 键 词：单片机 步进电机 迈克尔逊干涉仪 微小长度测量 薄膜厚度测量 

分 类 号：TN911-34[电子电信—通信与信息系统]