P_2O_5对氟镓铟基玻璃析晶稳定性和结构的影响  

Effect of P_2O_5 Contents on Crystallization Stability and Structure of Ga-and In-Based Fluoride Glasses

作　　者：朱基千[1,2] 杨智杰[2] 周凯[2] 

机构地区：[1]同济大学材料科学与工程学院,上海200092 [2]同济大学物理系,上海200092

出　　处：《同济大学学报（自然科学版）》2011年第4期572-575,共4页Journal of Tongji University:Natural Science

摘　　要：以20GaF3-15InF3-20CdF2-15ZnF2-10SnF2-20PbF2(GICZSP)为基玻璃,用P2O5替代等摩尔含量CdF2,以改善玻璃的抗析晶能力.利用差示扫描量热分析、拉曼光谱和X射线衍射分析手段,表征不同含量P2O5对玻璃抗析晶性能及结构的影响.结果表明,P2O5的引入提高了玻璃的析晶稳定性.P2O5在玻璃中以不含P O双键的[PO44-,Q0]四面体存在.随着P2O5量的增加,新出现了M[O,F]6八面体结构.To improve the ability of anti-crystallization,P2O5 was introduced to substitute CdF2 in the fluoride glass,consisting of 20GaF3-15InF3-20CdF2-15ZnF2-10SnF2-20PbF2（GICZSP）.The effect of P2O5 contents on crystallization stability and structure was studied by differential scanning calorimetry（DSC）,Raman spectroscopy and X-Ray Diffraction analyses（XRD）.The results indicate that P2O5 can improve the crystallization stability.P2O5 exists as [PO4-4,Q0] tetrahedron which has no PO bond.When the amount of P2O5 being increased,a new M6 octahedral structure emerges.

关 键 词：氟化物玻璃 析晶稳定性 差示扫描量热分析 拉曼光谱 X射线衍射分析 

分 类 号：TQ171.1[化学工程—玻璃工业]