模拟集成电路可靠性技术探讨  

Discussion on Reliability Technologies for Analog Integrated Circuits

作　　者：邢宗锋[1] 梁剑波[1] 罗俊[1] 

机构地区：[1]中国电子科技集团公司第二十四研究所,重庆400060

出　　处：《微电子学》2011年第3期456-460,共5页Microelectronics

摘　　要：高性能模拟集成电路产品需要复杂的工艺来实现高速、低噪声、高精度等要求,这些复杂性给各种技术都带来了严峻的可靠性考验。重点阐述了通用IC工艺器件的可靠性机理和面临的可靠性挑战。为了满足更广领域IC的可靠性需求,深入研究器件的可靠性特性与传统的工艺可靠性保证条件同样重要。Unique analog product application requirements such as high speed,low noise,low power,high precision and high voltage demand sophisticated analog process technologies,which poses several reliability challenges that are specific to each technology.Some of the key reliability mechanisms in most common analog process technologies are highlighted.To meet broad range of analog IC reliability requirements,in-depth device reliability characterization is essential,in addition to traditional process reliability qualification.

关 键 词：模拟集成电路 混合信号集成电路 可靠性 

分 类 号：TN43[电子电信—微电子学与固体电子学]