线扫描缺陷检测系统中的LED光源设计  

Design of LED Illuminators Used in Line Scan Defect Inspection System

作　　者：徐岩[1] 史燕琼[1] 

机构地区：[1]合肥工业大学仪器科学与光电工程学院,安徽合肥230009

出　　处：《光学与光电技术》2011年第3期28-30,43,共4页Optics & Optoelectronic Technology

摘　　要：光源是影响机器视觉输入系统的重要因素,直接影响输入数据的质量和至少30%的应用效果。在线扫描缺陷检测系统中,对光源的亮度、均匀性、直线性、寿命、光谱范围都提出了较高的要求。鉴于LED光源在机器视觉中具有许多优点,以LED线形光源为例,探讨了线形阵列LED光源照明光场分布的影响因素,结合柱面镜对光源单方向约束的特性,介绍了LED阵列和柱面镜组合的聚焦条形照明光源的设计方法。通过仿真,证明了该设计可满足线扫描系统对光源的要求。The light source is an important factor that affects the image quality obtained by a machine vision system. The improper use of an illuminator may degrade the image quality up to 30%. In a line scan defect inspection system, the illumina tor properties, such as brightness, light array linearity, lifetime and spectrum range, are more critical. In view of the factor that LED light used in machine vision has many advantages, in the paper the design of a LED line illuminator is introduced. During the design, the power distribution of a LED light is firstly analyzed, and then the illuminator is implemented by using a LED array and a cylindrical lens. At last, the design method is verified by simulation.

关 键 词：线扫描 缺陷检测 LED条形光源 设计 

分 类 号：TH74[机械工程—光学工程]