不完全匹配吸收方法测试激光二极管阵列寿命  

Life Test of Laser Diode Arrays with the Incomplete Matching Absorption Method

作　　者：闫立华[1] 徐会武[1] 任永学[1] 王晓燕[1] 杨红伟[1] 安振峰[1] 

机构地区：[1]中国电子科技集团公司第十三研究所,石家庄050051

出　　处：《微纳电子技术》2011年第7期472-476,共5页Micronanoelectronic Technology

摘　　要：在激光二极管阵列泵浦高可靠固体激光器的研制和应用中,激光二极管阵列的寿命至关重要。通过搭建不完全匹配吸收固体激光寿命实时监测系统,实现了800nm激光二极管阵列的寿命测试。实验对固体激光系统输出能量的下降率、激光二极管阵列损毁程度以及激光二极管阵列的功率下降率进行比较分析,同时对比讨论了同批次阵列在常规测试条件下的寿命测试结果。结果表明:该固体激光系统在1.03×108个脉冲输出后激光二极管阵列的老化效果与同批阵列常规测试下在1.52×108脉冲输出后的老化效果相当,验证了该系统用于评价激光二极管阵列寿命的可行性。最后,基于半导体激光器的退化机理,结合光线追迹软件的模拟结果,讨论了不完全匹配吸收方法在寿命测试过程中的加速作用。The life span of the laser diode（LD） arrays is the most crucial factor in the development and application of the LD arrays pumped high reliable solid-state-laser.The life test of 800 nm LD arrays in this system was obtained by building up incomplete-matching absorption solid-state-laser life test system.The experimental comparison of the decreasing rate of the output energy for the solid-state-laser,the apparent damage degree of the LD arrays and the decreasing rate of the power for the LD arrays were analyzed.Besides that,the discussion was carried out with the life test result of the same lot arrays under the regular test condition.The result shows that the life test effect of this system with 1.03×108 pulses is equal to that of 1.52×108 pulses.Thus the life test method of the system for the LD arrays was proved to be feasible.Finally,based on the degradation mechanism of the semiconductor laser,the acceleration effect of the incomplete-matching absorption method for the life test was discussed combined with the simulation result of the beam tracing software.

关 键 词：寿命测试 激光二极管阵列 不完全匹配吸收 泵浦 加速 

分 类 号：TN365[电子电信—物理电子学] TN248.4