Reducing test-data volume and test-power simultaneously in LFSR reseeding-based compression environment  

作　　者：王伟征 邝继顺 尤志强 刘鹏 

机构地区：[1]College of Information Science & Engineering,Hunan University

出　　处：《Journal of Semiconductors》2011年第7期115-121,共7页半导体学报（英文版）

基　　金：Project supported by the National Natural Science Foundation of China(Nos.60673085,60773207)

摘　　要：This paper presents a new test scheme based on scan block encoding in a linear feedback shift register （LFSR） reseeding-based compression environment.Meanwhile,our paper also introduces a novel algorithm of scan-block clustering.The main contribution of this paper is a flexible test-application framework that achieves significant reductions in switching activity during scan shift and the number of specified bits that need to be generated via LFSR reseeding.Thus,it can significantly reduce the test power and test data volume.Experimental results using Mintest test set on the larger ISCAS＇89 benchmarks show that the proposed method reduces the switching activity significantly by 72%-94%and provides a best possible test compression of 74%-94%with little hardware overhead.This paper presents a new test scheme based on scan block encoding in a linear feedback shift register （LFSR） reseeding-based compression environment.Meanwhile,our paper also introduces a novel algorithm of scan-block clustering.The main contribution of this paper is a flexible test-application framework that achieves significant reductions in switching activity during scan shift and the number of specified bits that need to be generated via LFSR reseeding.Thus,it can significantly reduce the test power and test data volume.Experimental results using Mintest test set on the larger ISCAS＇89 benchmarks show that the proposed method reduces the switching activity significantly by 72%-94%and provides a best possible test compression of 74%-94%with little hardware overhead.

关 键 词：built-in self-test LFSR reseeding test power test compression scan block 

分 类 号：TP333[自动化与计算机技术—计算机系统结构]