电阻率剖面法探测深度的研究  

STUDY OF INVESTIGATION DEPTH OF ELECTRICAL RESISTIVITY PROFILING METHOD

作　　者：霍军廷[1] 吴信民[1] 李乃民[1] 

机构地区：[1]东华理工大学,江西抚州344000

出　　处：《物探化探计算技术》2011年第4期418-423,348,共6页Computing Techniques For Geophysical and Geochemical Exploration

基　　金：江西省自然科学基金项目(2010GZW003)

摘　　要：在考虑了异常体的形态、异常体和围岩的电性差异、供电极和接收极测量误差、供电电流误差、仪器测量精度,以及外界干扰等因素的基础上,提出了用电位异常来描述电阻率剖面法中探测深度的定义。通过编程,计算得到各向同性均匀半空间中球体异常,在电阻率剖面法中的电位异常,得出在特定条件下的探测深度。定量分析了联合剖面法中探测深度与电极距AO、供电电流和外界干扰的关系。制作并完成了软件的各种正演计算,可以为电阻率剖面法野外施工前的电极距大小、供电电流的设计等提供参考。By taking account of the shape of abnormal body, the differences of electrical properties between abnormal body and wallrock, measurement errors of current electrodes and received electrodes, electric current error, measurement accuracy of electrical apparatus and external distrubance, this paper proposes the definition of the investigation depth of electrical resistivity profiling method with volage anomaly. The volage anomaly of sphere anomaly body is computed in the homogeneous half-space within united profiling method through programming, and the depth of investigation under certain conditions is obtained. The quantitative analysis is made for the relationships between depth of investigation and the span of AO, electrical current and external disturbance. The forward calcualtion which has been made in the software used in this article can supply guides for design of span of electodes and electrical current within eclectrical profiling methods.

关 键 词：电剖面 联合剖面 探测深度 定量分析 

分 类 号：P631.322[天文地球—地质矿产勘探]