超声表面波检测的局部频域特征分析方法初探  

A Preliminary Study on Surface Identification Method Based on Ultrasonic Local Spectrum Analysis

作　　者：蒋志峰[1] 吴瑞明[2] 

机构地区：[1]浙江省计量科学研究院,杭州310013 [2]浙江科技学院机械与汽车工程学院,杭州310023

出　　处：《科技通报》2011年第4期571-574,共4页Bulletin of Science and Technology

基　　金：浙江省科技计划科研项目(2009C31015)

摘　　要：在自行构建的超声频谱分析系统上,研究表面缺陷对声波调制的声学机理,提出一种基于单缺陷回波的局部频谱分析而对表面缺陷类型进行检测的方法,给出了用超声频域分析法对工件表面缺陷特征分析的实例,并用计算机检测系统得出了相应的试验结果,从而提高了检测可靠性。此检测方法可成为计算机辅助对缺陷进行分析的依据。According to the uhrasonic spectrum analysis system,this paper studied the acoustic mechanism of surface defects. Based on partial spectrum analysis of single flaw echo, the surface defects were tested. The thesis gave some examples of ultrasonic surface-wave detection. The feature was acquired through spectrum analysis. The result was verified by the computer detection system. The reliability Of detection was improved. The analysis method can be applied as the basis for computer aided test or automatic non-destructive test.

关 键 词：无损检测 超声频谱 超声表面波探伤 

分 类 号：TB526[理学—物理]