用原子力显微镜研究XLPE电缆老化  

Application of Atomic Force Microscope to Study of Aging in XLPE Power Cable

作　　者：张晓虹[1] 乐波[1] 蒋雄伟[1] 王振华[1] 谢恒堃[1] 雷清泉[2] 

机构地区：[1]西安交通大学,西安710049 [2]哈尔滨理工大学,哈尔滨150040

出　　处：《高电压技术》1999年第4期21-23,26,共4页High Voltage Engineering

摘　　要：借助于原子力显微镜观测未老化的、实验室老化和现场老化的XLPE电缆试样的结构形态变化，得到了nm尺度的结构细节，通过对比观测经低能电子束轰击和现场老化的XLPE试样表面，发现二者具有相似的结构特征，说明“热”电子对于聚合物高电场老化负有重要责任。Investigating the changc in morpbology of XLPEunderground power cable due to effect of bigh electricalstress is of great advantage to understand the aging mecha-nism of polytner. The morphology of unaged, Laboratory-aged and field aged XLPE samples have been observed bymeans of atomic force microscope and structural dctail in nmsize has been obtained. Both unaged XLPE samples exposedto a low-energy (30eV) electron beam and field-aged XLPEsamples have been compared and the similar structure fea-tures have been found. It is proved that 'hot' electronssbould be responsible for aging of XLPE insulation in under-

关 键 词：交联聚乙烯电缆 老化 原子力显微镜 腐蚀 

分 类 号：TM247.07[一般工业技术—材料科学与工程]