α、β表面沾污检定仪研制  

Development of α/β Surface Contaminated Measurement

作　　者：郑慧[1] 文德智[1] 成晶[1] 卓仁鸿[1] 张少华[1] 

机构地区：[1]中国工程物理研究院电离辐射计量站,四川绵阳621900

出　　处：《核电子学与探测技术》2011年第5期526-529,567,共5页Nuclear Electronics & Detection Technology

摘　　要：设计了一种α、β表面沾污检定仪,可以精确调整和控制源-探测器距离,能适应不同形状和尺寸的被检仪器探头外形,并降低这些因素带来的不确定度,给出了该检定仪的实际应用结果,符合相关计量检定规程的要求。A verification device for α/β surface contaminated detector are developed,by which the source-detector distance can be adjust and controlled precisely and different dimension or shape detector can be fitted and the calibration uncertainty can be reduced.An application of the device is brifely introduced and the results show that it satisfy the demand of the verification regulation well.

关 键 词：α、β表面沾污仪 检定架 检定 校准 计量检定规程 

分 类 号：TL8[核科学技术—核技术及应用]