透射式特征X射线测厚仪研制  

Exploiture Thickness Gauge of Transmission Characteristic X-ray

作　　者：赵越[1] 屈国普[1] 郑贤利[1] 黄云[1] 

机构地区：[1]南华大学核科学技术学院,湖南衡阳421001

出　　处：《核电子学与探测技术》2011年第5期591-594,共4页Nuclear Electronics & Detection Technology

基　　金：核技术及应用湖南省重点学科资助

摘　　要：论述了透射式特征X射线测厚原理,并对样机的硬件组成特征X射线发生装置、X射线探测器、数据处理器和监控软件进行了介绍。通过对测厚样机的实验测试,结果显示测量较薄物质时测厚仪反应灵敏,测量精度较高,相对误差在±5%以内,达到设计要求。The theory of transmission characteristic X-ray measurement thickness are discussed,hardware including equipment for characteristic X-ray producing,X-ray detector,data processor and monitoring software are introduced.Properties of the thickness gauge are tested,results show thickness gauge is sensitive,higher accuracy when tested material is thin,relative error within 5%,according with design request.

关 键 词：特征X射线 数据处理器 监控软件 性能分析 

分 类 号：TL99[核科学技术—核技术及应用]