竞争失效产品步进应力加速寿命试验的优化设计  

Optimum Step-Stress Accelerated Life Tests With Competing Causes of Failure under Exponential Distribution

作　　者：刘立喜[1] 葛广平[2] 

机构地区：[1]上海财经大学统计系 [2]上海大学理学院数学系,上海200072

出　　处：《应用概率统计》1999年第4期351-362,共12页Chinese Journal of Applied Probability and Statistics

基　　金：国家自然科学基金

摘　　要：本文在一般ｋ个未知参数的加速寿命方程下，以各失效机理的对数平均寿命的ＭＬＥ的渐进方差之和最小为准则，解决了指数分布场合下具有ｐ（ｐ≥１）个竞争失效机理的产品，ｋ个应力情况下的步加试验的优化设计问题．本文既可以看成是Ｄ．Ｓ．Ｂａｉ，Ｙ．Ｒ．Ｃｈｕｎ（１９９１）的推广，又可以看成是程依明（１９９４）的推广．In this paper, we consider the optimum time-step and failure-step stress accelerated life tests with competing causes of failure, which life of each failure cause is assumed to be exponential. We obtain the optimum test designs to minimize the sum of asymptotic Variance the Maximum Likelihood Estimation (MLE) of the log mean life in each cause at a design stress. We generalize a number of results, which are shown in other papers ago.

关 键 词：步加试验 竞争失效机理 优化设计 寿命试验 

分 类 号：O213.2[理学—概率论与数理统计]