CMOS成像系统亚像元定位精度研究  

Sub-pixel Locating Accuracy for a CMOS Imaging System

作　　者：曾桂英[1] 解源[1] 

机构地区：[1]集美大学信息工程学院,福建厦门361021

出　　处：《光电工程》2011年第7期69-73,80,共6页Opto-Electronic Engineering

基　　金：福建省青年人才创新项目(2008F3078)

摘　　要：本文构建了基于CMOS图像传感器的高精度定位系统,并且研究光源、被测目标、测量系统与亚像元定位算法等因素对定位精度的影响。研究结果表明:光源与测量环境的稳定性是高精度测量的必要前提与关键因素;带阈值的质心算法对系统白噪声抑制能力基本相同,但对具有一定规律缓慢变化的干扰信号抗干扰能力不同,且带活动阈值的质心算法抗干扰能力最强;根据被测目标与实际误差分布规律选择合适的算法处理,是工程应用中实现高精度亚像元定位的有效保证。To study the influence of the light source, object, measuring system and subpixel location algorithm on the sub-pixel locating accuracy, a CMOS imaging system is designed for experiment and data treatment. The results show that the stability of the source and the measuring surroundings have notable effect on the high accuracy of measurements. The improved centroid algorithm with a threshold has the same effect on de noise but can reduce the interference signal dramatically and especially with a dynamic threshold while the interference signal has the property of slight change. Choosing an algorithm appropriately according to the real object and the error distribution is the key to gain the high precision subpixel location in engineering application.

关 键 词：CMOS图像传感器 亚像元定位 定位精度 误差分析 

分 类 号：TP75[自动化与计算机技术—检测技术与自动化装置]