弹载数据测试存储装置的研究  

The Research of the Missile-mounted Data Test Storage Device

作　　者：武珺[1] 任海[1] 李飞[1] 刘述[1] 

机构地区：[1]中北大学机电工程学院,山西太原030051

出　　处：《机械管理开发》2011年第4期193-194,共2页Mechanical Management and Development

摘　　要：数据存储装置是现代测试技术的一个关键组成部分。弹载测试存储装置通过高速缓存将数据分批、分块缓存于RAM,在导弹落地后回收数据存储器,进行数据后续处理。课题以单片机为核心,通过设计C8052单片机与SD卡模块的硬件接口电路,进行数据读写,进而用软件验证整个系统的可靠性,并在整个设计过程中探索提高数据存储速度的方法。The data storage device is an essential constituent of the modern test technology. The missile-mounted test memory unit bufter the data with high speed, buffer in RAM piecemeal, recycles the data-carrier storage after missile landing, then carries on the data following processing. This topic takes the MCU as a core, designs the C8052 monolithic integrated circuit and the SD card module hardware interface electric circuit, carries on the data read-write, then with the software confirmation overall system＇s reliability, and explores in the entire design process raises the data storage speed the method.

关 键 词：SD卡 SPI模式 单片机 

分 类 号：TP368.1[自动化与计算机技术—计算机系统结构]