IEEE1149.4模拟和混合信号测试总线标准  

Review on IEEE 1149.4 analog and mixed signal test bus standard

作　　者：姜岩峰[1,2] 张东[1] 王鑫[1] 

机构地区：[1]北京自动测试技术研究所,北京100088 [2]北方工业大学微电子中心,北京100144

出　　处：《电子测试》2011年第7期16-19,74,共5页Electronic Test

基　　金：北京市科学技术研究院创新团队计划项目资助(IG201005N)

摘　　要：模拟和混合信号边界扫描标准(IEEE1149.4)是针对电路板级外部分立元件的测试而发展起来的,该标准与IEEE1149.1兼容,另外,在此基础上,IEEE1149.4又增加了两根线,用来控制模拟信号。目前1149.4的标准,不但应用在传统的电路板上,在混合信号集成电路甚至包含混合信号的SoC系统芯片上,都有应用。本文主要描述该测试标准的基本架构,提出系统测量方法及应用实例,希望对于该标准在国内的应用有一定推广意义。The Analog and Mixed-Signal Boundary-Scan Standard, IEEE1149.4 was developed to measure external discrete components in a mixed-signal Printed Circuit Assembly （PCA）. This bus uses 4 of the same signals used today to support IEEE1149.1 compliant devices and systems. It uses two additional wires bus to perform analog monitoring and control. But testing a mixed-signal PCA is a crucial issue not only when the PCA is a traditional board but also for what is often in System on Chip （SoC） with embedded mixed-signal module. Although the original intention of the boundary-scan standard was to make provision for mixed-signal chips on boards of all kinds, SoC testing solutions cover the needs for board testing. This paper describes the basic architecture of the test bus, gives some system measurement methodologies and provides basic examples of usage.

关 键 词：混合信号 IEEE1149.4标准 边界扫描 

分 类 号：TN407[电子电信—微电子学与固体电子学]