电感耦合等离子体质谱法测定高纯铼中26种痕量杂质元素  

Determination of 26 trace-impurities in high purity rhenium by ICP-MS

作　　者：李继东[1] 王长华[1] 郑永章[1] 

机构地区：[1]北京有色金属研究总院,北京100088

出　　处：《分析试验室》2011年第8期39-43,共5页Chinese Journal of Analysis Laboratory

基　　金：国家科技支撑计划及科研用高纯无机试剂核心单元物质及共性关键技术的研究与开发(2006BAF07B02)资助

摘　　要：以电感耦合等离子体质谱法(ICP-MS)测定了高纯铼中26种杂质元素含量。应用反应池技术消除了复合离子对K、Ca、Fe等元素的干扰,采用干扰方程校正技术消除了Re氧化物对Tl的质谱重叠干扰,未受干扰的其它杂质元素采用内标校正法直接测定。考察了溶液酸度、基体效应等条件对测定的影响,优化选择了测定同位素和内标元素。方法测定下限介于0.12～5.0μg/g,加标回收率在90%～110%之间,相对标准偏差小于10%。方法可以满足4N5高纯铼的测定。The 26 trace-impurities in high purity rhenium were determined by ICP-MS in this paper. The interferences for K, Ca,Fe and T1 produced by polyatomic ions were eliminated by reaction cell technology and the interference equation. Under the optimized conditions the acid and matrix effects were investigated. Determination limits obtained ranged between 0. 12 and 5.0 μg/g for this 26 impurities. The accuracy of the method was evaluated by recovery measurements on spiked samples, and good recovery results （90% - 110% ） with precision of less than 10% were achieved. The method can be used for the analysis of 4N5 high purity rhenium products.

关 键 词：电感耦合等离子体质谱法 反应池技术 高纯铼 杂质元素 

分 类 号：O657.63[理学—分析化学]