基于边界扫描的混装电路板测试技术研究  

Study on Test Method of Mixed Circuit Board Based on Boundary Scan

作　　者：蔡士闯[1] 王学伟[1] 王成刚[2] 

机构地区：[1]海军航空工程学院控制工程系,烟台264001 [2]海军航空工程学院基础实验部,烟台264001

出　　处：《舰船电子工程》2011年第7期137-140,共4页Ship Electronic Engineering

摘　　要：随着越来越多的FPGA等复杂逻辑器件应用到武器装备电路板上,电路板上JTAG器件与非JTAG器件并存,并使电路板结构功能日趋复杂,导致传统的方法已不能对该类电路板进行有效的测试。因此,对这种含复杂逻辑器件的混装电路进行测试是迫切需要解决的难题。为此,提出了一种基于onTAP软件实现针对该类电路板边界扫描的测试方法。With more and more FPGA and other complex logic devices are applied to circuit board of weapons. JTAG devices and non-JTAG devices exist on the circuit board, so that the structure and function board has become more complex and the traditional method can not be effective in this kind of circuit board testing. Therefore, the testing of the mixed circuit with complex logic device is urgent to solve the problem. For this, a testing method based onTAP for such boundary scan testing is proposed.

关 键 词：测试 混装电路 边界扫描 

分 类 号：TN407[电子电信—微电子学与固体电子学]