The application of back-scattered electron imaging for characterization of pearlitic steels  

作　　者：GUO Ning LIU Qing XIN YunChang LUAN BaiFeng ZHOU Zheng 

机构地区：[1]Department of Materials Science and Engineering, Chongqing University, Chongqing 400044, China

出　　处：《Science China(Technological Sciences)》2011年第9期2368-2372,共5页中国科学（技术科学英文版）

基　　金：supported by the National Key Technology R&D Program of China(Grant No.2007BAE15B01);the Major Program of the National Natural Science Foundation of China(Grant No.50890170)

摘　　要：The microstructures of pearlitic steel wire rods and steel wires are commonly characterized by secondary electron imaging (SEI)technique using scanning electron microscopy(SEM).In this work,a back-scattered electron imaging(BSEI)method is proposed to determine the microstructures of undeformed and deformed pearlitic steels with nanometer scale pearlite lamellae.The results indicate that BSEI technique can characterize the pearlite lamellas veritably and is effective in quantitative measurement of the mean size of pearlite interlamellar spacing.To some extent,BSEI method is more suitable than SEI technique for studying undeformed and not severely deformed pearlitic steels.

关 键 词：pearlitic steels MICROSTRUCTURES back-scattered electron imaging （BSEI） cold drawing 

分 类 号：TB852.1[一般工业技术—摄影技术] TG142.21[一般工业技术—材料科学与工程]