高功率半导体激光器测试系统  

Establishment of High Power Semiconductor Laser Test System

作　　者：沈牧[1] 任永学[1] 王晓燕[1] 程义涛[1] 

机构地区：[1]中国电子科技集团公司第十三研究所,石家庄050051

出　　处：《半导体技术》2011年第8期646-650,共5页Semiconductor Technology

摘　　要：利用SGI40-125AAA型程控直流电源、PCI-GPIB卡、电压表、功率计表以及光谱仪等建立高功率半导体激光器测试系统,并在LabVIEW环境下开发了测试软件,通过软件控制直流电源、功率计表等仪器的触发输出、触发输入实现测试设备的同步工作,在保证测试准确性的同时,实现了快速(每个测试点的工作时间约300 ms)的扫描测试,在测试速度上比多个仪器单独测试有了明显提高。可以实现千瓦级连续工作半导体激光器的光功率P、电压V、电光转换效率η、阈值电流、光谱等参数的扫描测试。建立的测试系统准确度高,扫描速度快,测试软件界面操作方便,显示结果直观、全面。High power semiconductor laser diode test system is built-up by using SG140-125AAA programming DC source,PCI-GPIB card,voltmeter,power meter,spectrometer,etc.Developed test software is based on LabVIEW platform.Through controlling the DC source and the trigger out and trigger in,on the pwer meter,carrying out test instruments synchronization and rapidly scanning test（about 300 ms per test point） with high accuracy,the system has obviously higher test speed than that the test methods with separately operating instruments.It can realized the sweep test of the kilowatt semiconductor laser diode parameters such as laser power,diode voltage,photoelectric conversion efficiency,threshold current and spectrum parameters.The test system is with high accuracy,fast sweep and convenient control interface.The results are visua and comprehensive.

关 键 词：半导体激光器 流程图 扫描测试 P-I曲线 V-I曲线 

分 类 号：TN365[电子电信—物理电子学]