微波铁氧体的可靠性研究  

The reliability research of microwave ferrite

作　　者：邵峰[1] 郑振中[1] 蒋华峰 

机构地区：[1]天通控股股份有限公司,浙江海宁314400

出　　处：《磁性材料及器件》2011年第4期45-48,共4页Journal of Magnetic Materials and Devices

摘　　要：采用陶瓷氧化物工艺制备了纯YIG和小线宽YIG样品,设计了高温寿命、温度冲击和稳态湿热等三组环境试验,测量了样品的饱和磁化强度Ms,介电损耗角正切tanδε及铁磁共振线宽ΔH。实验结果表明,Ms对环境的适应性较好,而ΔH和tanδε受环境影响较大,尤其是tanδε受环境影响最大。总体而言,小线宽YIG材料的性能随环境变化大于纯YIG材料,这可能是离子取代引起的。对材料性能变化而言,三种试验中,高温湿热的影响最明显,高温次之,而温度冲击最弱。The pure garnet and narrow line width garnet samples were prepared by ceramic oxide process, and the reliability of samples were researched by three experiments. Three experiments including high temperature life, temperature cycling and steady damp-heat experiment, respectively, were carried out on the samples, and Ms, AH and tanδε, were measured before and after the test to find their changes. The results showed that there is no obvious change in Ms after environment tests, and obvious changes occur in AH and especially tanδε after the tests. In general, the property changes of narrow line width samples is bigger than that of pure YIG samples, which is possibly related to ion doping. For the three experiments, descending sensitivity of material property changes of the two kinds of samples is steady damp-heat, high temperature and temperature cycling experiments.

关 键 词：微波铁氧体 可靠性 饱和磁化强度 铁磁共振线宽 介电损耗角正切 

分 类 号：TM277[一般工业技术—材料科学与工程]