基于FPGA的存储测试系统的设计  

Design of Storage Testing System Based on FPGA

作　　者：刘成明[1] 李新娥[1] 张艳兵[1] 

机构地区：[1]中北大学电子测试技术国家重点实验室仪器科学与动态测试教育部重点实验室,山西太原030051

出　　处：《山西电子技术》2011年第4期41-42,共2页Shanxi Electronic Technology

摘　　要：针对某些特殊的测试试验要求测试系统高性能、微体积、低功耗,在存储测试理论基础上,进行了动态存储测试系统的FPGA设计。介绍了该系统的组成,对控制模块进行了详细设计。针对测试环境的多样性设计了采样策略,能对频率多变的信号进行实时记录。通过实验验证了设计的正确性,证实了所设计的采样策略对多种变化规律的信号采集具有通用性,扩展了系统的应用范围。In some special tests and experiments, not only the characters of small volume and low consumption, but also the function of recording a large quantity of data is requested. A solution for data compress based on FPGA is proposed. The basic theory of LZW algorithm is introduced firstly. Then the method to achieve the algorithm by FPGA is described in detail. For the part of data acquisition, FPGA is used to realize the control of A/D converter, the negative skewed technology, the internal trigger and external trigger programmable controlling technology. Lots of tests show clearly that the working of system is steadily, the compression speed is fast, the effect is good on data compression, and the working electric current is low, so it realizes the integration of three with speed, performance and consumption.

关 键 词：FPGA 存储测试 采样策略 变频采样 

分 类 号：TP274.2[自动化与计算机技术—检测技术与自动化装置]