沉积不连续NiTi形状记忆合金薄膜PZT的阻尼性能  

Damping Capacity of PZT Deposited Discontinuous NiTi SMA Thin Film

作　　者：张玉姣[1] 刘庆锁[1] 陆翠敏[1] 李伟[1] 卢明超[2] 

机构地区：[1]天津理工大学材料科学与工程学院,天津300384 [2]公安部天津消防研究所,天津300381

出　　处：《机械工程材料》2011年第8期22-25,29,共5页Materials For Mechanical Engineering

基　　金：天津市自然科学重点基金资助项目(09JCZDJC23000)

摘　　要：在铁电陶瓷锆钛酸铅(PZT)表面沉积不连续的NiTi形状记忆合金(SMA)薄膜,运用XRD、SEM和动态弹性模量测试仪研究了其显微组织及阻尼特性。结果表明:与PZT相比,NiTiSMA薄膜/PZT复合材料的阻尼性能下降;原因是PZT基体与NiTi SMA薄膜在晶化冷却时的收缩不一致导致在PZT基体中靠近薄膜的区域形成了组织异常区,限制了电偶极子的运动,在外界应力作用下薄膜与基体两者的应变不协调加强了异常区对电偶极子运动的限制。The discontinuous NiTi shape memory alloy （SMA） film was deposited on PZT surface. The microstructure and damping capacities of the material had been studied by using XRD, SEM and dynamic elastic modulus tester. The results show that the damping capacity of the composite of NiTi SMA film/PZT decreased comparing with PZT. The reason was that the inconsistent contraction of NiTi SMA film and PZT matrix during crystallization cooling formed a structure anomalous area in the PZT matrix near the film, which limited the movement of electric dipole. Under the influence of outside stress, the harmonious strain between thin film and matrix strengthened the limiting of the anomalous area on electric dipole movement.

关 键 词：锆钛酸铅(PZT) NITI 形状记忆合金 显微组织 阻尼 

分 类 号：TB333[一般工业技术—材料科学与工程]