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作 者:才华[1] 朱延明[1] 郭玉双[2] 柏锡[1] 李勇[1] 纪巍[1]
机构地区:[1]东北农业大学生命科学学院,哈尔滨150030 [2]贵州省烟草科学研究所,贵阳550081
出 处:《东北农业大学学报》2011年第7期107-113,共7页Journal of Northeast Agricultural University
基 金:国家转基因生物新品种培育重大专项(2011ZX08004-001;2008ZX08004-004);国家高技术研究发展"863"计划(2008AA-10Z153);黑龙江省科技计划重大攻关项目(GA06B103-4)
摘 要:外源基因在转基因植物中遗传和表达的稳定性直接关系到转基因材料的应用前景。研究以转chi+rip双价基因大豆株系G0431、G0433的T2、T3及T4连续世代为材料,通过PCR、Southern杂交、Real-time PCR进一步证明外源基因已经整合到大豆基因组中,并稳定遗传给后代;Real-time RT-PCR、Western杂交以及抗疫霉根腐病测定结果表明,外源抗真菌病双价基因在各个转基因世代已稳定表达。研究结果为该材料的育种应用打下了坚实基础。The research on the genetic stability of transgenic plants is necessary,which is important for further use the transgenic plants.The transgenic chi+rip fungal-resistant soybean(G0431,G0433) and their successive generations T2,T3 and T4 were studied in present paper.The two anti-fungal genes were stably co-intergrated in genome and transmitted over successive generations monitored by PCR,Southern Blot analysis and Real-Time PCR.The results of Real-time RT-PCR,Western Blot and the resistance to P.megasperma identified that no significant difference in the progenies of transformed plants till T4,indicating the resistance to P.megasperma was stably inherited over successive generations.The transgenic chi+rip fungal-resistant soybean would be valuable to develop new transgenic soybean varieties with high efficiency against fungal.
关 键 词:遗传稳定性 chi+rip双价基因 大豆 疫霉根腐病
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