某型设备外部接口综合测试系统研究  

Research on External Interface Integrated Test System of Certain Device

作　　者：房莉[1] 陈湘平[1] 邹正武[1] 

机构地区：[1]空军雷达学院,湖北武汉430019

出　　处：《仪表技术与传感器》2011年第7期102-105,共4页Instrument Technique and Sensor

摘　　要：针对某型设备大量外部接口进行手工测试时速度慢、准确性差等问题,基于PXI总线设计了易扩展的综合测试系统。系统按照模块化、标准化、规范化思想进行设计,系统具有自检功能,能够对被测设备所有接口进行全自动测试,也可以对部分接口或部分通道进行测试。该系统已被应用,实践表明系统能够满足测试需求,具有良好的扩展性。Aiming at the problems of handcraft testing speed and veracity to certain type of device＇s interfaces,this paper designed an easily expansible testing system based on PXI.The system designed according to modularization,standardization,the system can test itself,and can automatically test all interfaces of some type device,and can test part of interfaces or channels.The system has been put into practice.It is indicated that the system could satisfy the requirement of some type device＇s interfaces testing,and it could be easily expanded.

关 键 词：PXI总线 测试系统 接口 

分 类 号：TP317[自动化与计算机技术—计算机软件与理论]