多通道OLED器件寿命分析测试系统研制  被引量:4

Multi-Channel OLED Stress Test System

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作  者:余树福[1] 胡典钢[1] 王坚[1] 彭俊彪[1] 

机构地区:[1]华南理工大学高分子光电材料与器件研究所特种功能材料教育部重点实验室,广东广州510640

出  处:《液晶与显示》2011年第4期532-537,共6页Chinese Journal of Liquid Crystals and Displays

基  金:国家"863"项目(No.20090325;No.2008AA03A311);国家"973"项目(No.2009CB623600);国家自然科学基金项目(No.60937001;No.61036007)

摘  要:研发了一种多通道、多功能的OLED寿命分析测试系统。该系统可以在恒定驱动电流、恒定驱动电压、恒定发光强度3种不同驱动模式下同时对512路OLED器件进行寿命测试,并可实现对测试环境温度和湿度的控制,控制器件老化的环境。测试系统具有高精度和宽测试范围,操作电流范围为0.02~100mA,操作电压范围为0~24V。系统采用模块化设计,可以根据用户需求灵活地搭建512,256,128,64,32路测试系统。基于LabVIEW开发环境编写的系统软件具有非常友好的操作界面和断电自保护功能,保证了测试的连续性。A multi-channel OLED stress test system was designed and made. The system could simultaneously stress 512 OLED devices independently in constant current, constant voltage, or constant light intensity testing mode. The system has a wide range of testing conditions with output current from 0. 02 mA to 100 mA, and output voltage from 0 to 24 V. The system adopts a modular design which could easily build 512, 256, 128, 64, 32 channels based on users' needs. The application software built on LabVIEW development platform in cludes a user-friendly interface, and a self-protection feature from power failure, ensuring the continuity of the testing, and the safety of the data. With an environment chamber, the ambient temperature and humidity could be conveniently adjusted.

关 键 词:有机电致发光二极管 寿命 多通道 LABVIEW 老化测试 

分 类 号:TN383.1[电子电信—物理电子学]

 

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