基于红外线光电开关的测速系统设计与应用  

Design and Application of Speed Test System Based on Infrared Photoelectric Switch

作　　者：左兆陆[1] 郑宾[1] 丁高林[1] 吴健[1] 

机构地区：[1]中北大学电子测试技术国家重点实验室,太原030051

出　　处：《自动化与仪表》2011年第8期82-84,共3页Automation & Instrumentation

摘　　要：随着现代科技的不断进步,各个领域对测速系统的应用越来越多,同时也对测速精度的要求日益苛刻。文中提出一种基于红外线光电开关的测速系统,采用NI6251高速数据采集卡以及LabVIEW软件设计代替了传统的基于单片机或FPGA等自行设计的硬件电路所组成的数据采集分析系统,提高了测速系统的可靠性和测量精度。文中介绍了整个测速系统的工作原理、结构设计和软件设计,并进行了系统的误差分析。现场试验结果证明,该方法能够将高速直线运动物体的测试误差保证在0.0015%以内。With the constantly development of the modern science and technology,the speed test system have been applied in more and more fields,at the same time,the demand of the test precision become harsher and harsher.This paper puts forward a new test method based on infrared ray-photoelectric switch,using the hardware-NI6251 DAQ card and software-LabVIEW take the place of the traditional DAQ system based on the SCM and FPGA,improves the reliability and measuring precision of the system.Working principle,structure design and software design were introduced in this paper,including the analysis about the system errors.Experimental results prove that this method can ensure the test error in less than 0.0015% percent in the high speed linear motion of objects test.

关 键 词：测速系统 NI6251 LABVIEW 红外线光电开关 

分 类 号：TH741[机械工程—光学工程]