整流二极管的I_R对HTRB工作寿命的影响  

Influence of IR of Rectifier Diode on HTRB Service Life

作　　者：保爱林 傅剑锋 邓爱民 

机构地区：[1]绍兴旭昌科技企业有限公司,浙江绍兴312000

出　　处：《半导体技术》2011年第9期726-729,共4页Semiconductor Technology

摘　　要：整流器件在工作中的可靠性往往与其漏电流特别是在高温下的漏电流有密切关系,然而对高温下的漏电流往往关注不够。通过对常温与高温漏电流的对比测试,发现两者并没有一致的对应关系;通过对高温漏电流有较大差别的两组样品的高温反偏寿命试验表明:高温漏电流越大,高温反偏寿命越短,说明高温漏电流对高温反偏寿命有重要影响。依据此结果提出了通过对高温漏电流进行测试,实现对高温反偏寿命进行分档、筛选的设想。介绍了利用正向脉冲电流对二极管的pn结进行瞬态加热以实现对高温反向漏电流的快速测试的具体方法。The reliability of the rectifier device at work had close relationshi p with leakage current（IR）,especially the high temperat ure leakage current（HTIR）.However,the HTIR were concerned about not enough. Th rough the comparative test between the leakage current at normal temperature and high temperature,show that there is no consistent relationship between the two accordingly.The high temperuture reverse bias（HTRB） operation life test of two group samples with greater dif f erence on HTIR,indicates that the greater the HTIR,the shorter the HTRB operat ion life.It shows the HTIR has significant influence on HTRB operation life. Ac cording to the result,a method is proposed that test the HTIR for grading and s creening the HTRB operation life.A specific method,to quickly test the HTIR a fter heating the pn-junction by forward pulse current is introduced.

关 键 词：漏电流 高温反向偏压(HTRB) 加速寿命 威布尔分布 整流二极管 

分 类 号：TN313.5[电子电信—物理电子学]