^3He半导体夹心中子能谱仪  

Development of a ^3He semiconductor sandwich neutron spectroscopy

作　　者：李俊杰[1] 蒋勇[1] 郑春[1] 

机构地区：[1]中国工程物理研究院核物理与化学研究所,绵阳621900

出　　处：《核技术》2011年第9期705-709,共5页Nuclear Techniques

基　　金：中国工程物理研究院科学技术发展基金(2009B0103005)资助

摘　　要：介绍了3He半导体夹心谱仪的探头组件和电子学系统,开展了热中子调试,获得快中子临界装置上0.1–1.3 MeV的能谱数据。测量结果与6Li夹心谱仪在0.3–1.3 MeV范围非常符合,证明该谱仪用于测量快中子临界装置泄漏谱是可行的。The detector design and electronics system of a ^3He semiconductor sandwich spectroscopy is reported in this paper. The thermal neutron test is conducted and neutron spectra in 0.1-1.3 MeV in the critical assembly are measured. The results indicate that data of 0.3-1.3 MeV neutrons are consistent with the ^6Li spectroscopy. So the feasibility to measure leakage neutron spectra in the critical assembly using the ^3He spectrometer is proved.

关 键 词：中子能谱 夹心谱仪 符合法 快中子临界装置 

分 类 号：TL81[核科学技术—核技术及应用]