机器视觉在TFT-LCD点缺陷检测系统中的应用  

Application of Machine Vision in the TFT-LCD Point Defect Inspection System

作　　者：冯小波[1] 贺臻[1] 施旭[1] 

机构地区：[1]上海交通大学电子信息与电气工程学院,上海200240

出　　处：《现代显示》2011年第9期16-21,共6页Advanced Display

摘　　要：针对TFT-LCD点缺陷的特征和检测方法,介绍了机器视觉系统的基本构成,提出了一种基于Visual C++6.0集成开发环境,以EURESYS的eVision作为机器视觉和图像处理核心软件的TFT-LCD点缺陷检测方法。实验结果表明,该方法能够快速高效地实现点缺陷的自动检测功能,具有良好的鲁棒性,并为后续复杂缺陷的检测应用提供了一条参考思路。As for the characteristic and inspecting method of TFT-LCD point defect,the basic structure of machine vision system is introduced,a TFT-LCD point defect inspecting method is proposed,which is based on Visual C＋＋ 6.0 IDE,and the eVision supplied by EURESYS as the machine vision and image processing core software.The inspection experiments show that the proposed method can achieve the function of automatic inspecting of point defect rapidly and effectively with good robustness,and offer a reference idea for application of complex defect inspection.

关 键 词：机器视觉 TFT-LCD 点缺陷 

分 类 号：TN141.9[电子电信—物理电子学]