非接触三维测量中新的相位一高度分析模型  

A new model for analyzing phase-height mapping in 3D measurement based on fringe projection

作　　者：郑志平[1] 陈文静[1] 蒋模华[1] 

机构地区：[1]四川大学电子信息学院,成都610064

出　　处：《四川大学学报（自然科学版）》2011年第4期827-832,共6页Journal of Sichuan University(Natural Science Edition)

基　　金：国家自然科学基金(60838002;60677028)

摘　　要：提出了一种新的基于发散投影模型的三维面形测量的相位一高度分析算法.它不要求测量系统的投影光轴和成像光轴共面,入射光瞳和成像光瞳连线与参考平面平行的严格条件限制,光源发散投影分析更与实际情况相一致.该模型避免了实际应用中校正双瞳的麻烦以及由于系统装置摆放不精确而造成的误差.使搭建平台更加的方便容易.而且测量过程只需要一帧条纹图,并不需要参考平面的条纹图,使测量更加方便快捷.A new phase-to-height mapping algorithm in 3D surface measurement based on nonparallel il- lumination is proposed.. In this new method, it is not necessary that the connecting-line between the exit pupil of the projecting lens and the entrance pupil of the imaging lens is horizontal and set to parallel to the reference plane. And the projection optical axis and the imaging optical axis can not need to cross at the same point on reference plane. In addition9 the nonparallel illumination analysis is coincident with practical system. This method offers a flexible way for us to build the measurement system to obtain the full-field fringes through moving either location of the projector or imaging device. Another advantage of this method is that only one fringe pattern is needed to finish the reconstruction of the 3D surface.

关 键 词：光学三维测量 条纹分析 相位测量法 相位-高度映射 

分 类 号：O43[机械工程—光学工程]