一种微带隔离器的失效原因定位分析  

Failure Reason Location and Analysis for a Microstrip Isolator

作　　者：郑石平[1] 罗惟惟[1] 

机构地区：[1]南京电子技术研究所,江苏南京210039

出　　处：《电子机械工程》2011年第4期62-64,共3页Electro-Mechanical Engineering

摘　　要：文中通过对某型号隔离器的失效原因分析,详细介绍了失效原因及其形成过程。经过反复试验,找到了有效的解决方案,进行了失效原因正确定位。要定位失效原因,必须对各种可能情况进行全面分析。在充分试验验证及一定时间的实践验证之后,才可认为查找到了真正引起失效的原因,改进后的方案才可靠有效。质量控制非常重要,应从实际情况出发,明确类似问题应如何进行有效的质量控制。The failure reason and form process of a microstrip ferrite isolator by failure analysis is introduced in detail.The effective solution is found and the failure reason is properly located after experiments.All possible cases must be analyzed to locate the failure reason.The real failure reason can be found and the improved solution can be reliable or effective after enough test validation and practical validation of a period of time.Quality control is very important.Therefore,it should be clear how to perform quality control about the similar problems from the real situation.

关 键 词：失效分析 质量控制 微带隔离器 

分 类 号：TN627[电子电信—电路与系统]